NanoModeScan M² Measuring System
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Automatic M² Measurement Solution with Scanning Slit Profiler
This scanning slit M² measurement system accurately analyzes lasers with wavelengths from UV to Far Infrared with its silicon, germanium, or pyroelectric head. It features a compact portable design, immediate results, ISO compliant measurements, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of lasers of most wavelengths.
위치확인
위치확인
042 825 7084
대전 유성구 온천로 59 (봉명동, 동아벤처타워)( 59, Oncheon-ro, Yuseong-gu, Daejeon, Korea )
동아벤처타워 816호
- Scanhead Travel: 500mm
- USB 2.0Interface
- M² Analysis Software included
- Scanhead Travel: 500mm
- USB 2.0Interface
- M² Analysis Software included