Line Laser Profiling System – 200 mm
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Product ID: LLPS-200-LCM
- 190 to 1150 nm (model-dependent)
- Line laser length/width measurements
- Absolute vertical centroids
- Deviation of vertical centroids from a linear regression line
- Line tilt measured in degrees
위치확인
위치확인
042 825 7084
대전 유성구 온천로 59 (봉명동, 동아벤처타워)( 59, Oncheon-ro, Yuseong-gu, Daejeon, Korea )
동아벤처타워 816호
Direct measurement of line lasers up to 200 mm in length
- 190 to 1150 nm (model-dependent)
- Line laser length/width measurements
- Absolute vertical centroids
- Deviation of vertical centroids from a linear regression line
- Line tilt measured in degrees
Document | Type |
---|---|
Current Products: Specialized Beam Profiler Systems | |
Line Laser Profiling System Flyer | |
Application Notes | |
Line Laser Profiling System App. Note |
Direct measurement of line lasers up to 200 mm in length
- 190 to 1150 nm (model-dependent)
- Line laser length/width measurements
- Absolute vertical centroids
- Deviation of vertical centroids from a linear regression line
- Line tilt measured in degrees
Document | Type |
---|---|
Current Products: Specialized Beam Profiler Systems | |
Line Laser Profiling System Flyer | |
Application Notes | |
Line Laser Profiling System App. Note |