Beam'R2 – XY Scanning Slit Beam Profiler
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Product ID: S-BR2-Si
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Economical and accurate
- M² option – beam propagation analysis, divergence, focus
위치확인
위치확인
042 825 7084
대전 유성구 온천로 59 (봉명동, 동아벤처타워)( 59, Oncheon-ro, Yuseong-gu, Daejeon, Korea )
동아벤처타워 816호
XY Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
* model-dependent
Specification | Detail |
---|---|
Wavelength | Si detector: 190 to 1150 nm InGaAs detector: 650 to 1800 nm Si + InGaAs detectors: 190 to 1800 nm Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
Scanned Beam Diameters | Si detector: 5 µm to 4 mm‚ to 2 µm in Knife-Edge mode InGaAs detector: 10 µm to 3 mm‚ to 2 µm in Knife-Edge mode InGaAs (extended) detector: 10 µm to 2 mm‚ to 2 µm in Knife-Edge mode |
Beam Waist Diameter Measurement | Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat 1/e² (13.5%) width User selectable % of peak Knife-Edge mode for very small beam |
Measured Sources | CW; Pulsed lasers‚ Φ µm ≥ [500/(PRR in kHz)] |
Resolution Accuracy | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
Maximum Power & Irradiance | 1 W Total & 0.5 mW/µm² |
Gain Range | 1‚000:1 Switched; 4‚096:1 ADC range |
Displayed Graphics | X-Y Position & Profiles‚ Zoom x1 to x16 |
Update Rate | ~5 Hz |
Pass/Fail Display | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
Averaging | User selectable running average (1 to 8 samples) |
Statistics | Min.‚ Max.‚ Mean‚ Standard Deviation Log data over extended periods |
XY Profile & Centroid | Beam Wander display and logging |
Minimum PC Requirements | Windows, 2 GB RAM, USB 2.0/3.0 port |
Product specifications are subject to change without notice
eDrawings EASM | STEP 3D Model | Adobe PDF |
XY Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
* model-dependent
Specification | Detail |
---|---|
Wavelength | Si detector: 190 to 1150 nm InGaAs detector: 650 to 1800 nm Si + InGaAs detectors: 190 to 1800 nm Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
Scanned Beam Diameters | Si detector: 5 µm to 4 mm‚ to 2 µm in Knife-Edge mode InGaAs detector: 10 µm to 3 mm‚ to 2 µm in Knife-Edge mode InGaAs (extended) detector: 10 µm to 2 mm‚ to 2 µm in Knife-Edge mode |
Beam Waist Diameter Measurement | Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat 1/e² (13.5%) width User selectable % of peak Knife-Edge mode for very small beam |
Measured Sources | CW; Pulsed lasers‚ Φ µm ≥ [500/(PRR in kHz)] |
Resolution Accuracy | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
Maximum Power & Irradiance | 1 W Total & 0.5 mW/µm² |
Gain Range | 1‚000:1 Switched; 4‚096:1 ADC range |
Displayed Graphics | X-Y Position & Profiles‚ Zoom x1 to x16 |
Update Rate | ~5 Hz |
Pass/Fail Display | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
Averaging | User selectable running average (1 to 8 samples) |
Statistics | Min.‚ Max.‚ Mean‚ Standard Deviation Log data over extended periods |
XY Profile & Centroid | Beam Wander display and logging |
Minimum PC Requirements | Windows, 2 GB RAM, USB 2.0/3.0 port |
Product specifications are subject to change without notice
eDrawings EASM | STEP 3D Model | Adobe PDF |