Santec
TSL-770
Our highest accuracy, fastest tuning, lowest noise and narrowest linewidth laser.
- 200 nm/s Rapid Sweep
- Linewidth < 60 kHz
- < 1/10 Frequency Fluctuation (vs. conventional model)
- Fine tuning scan range 10 GHz
Overview
Our TSL-770 is the ideal choice for a wide range of applications, from production to basic research, due to its high speed, narrow linewidth, wide 160 nm tuning range and market leading accuracy and precision. A proprietary resonator design enhances Q value and wavelength stability, opening doors for photonic investigations in the most cutting-edge research applications.

Features&Characteristics
- Wide tuning range from 1480 to 1640 nm
If you require a different wavelength range, please refer to the TSL-550 which offers more wavelength ranges, with options from 1260 to 1680 nm. - Mode-hop-free with rapid sweeps up to 200 nm/s
- High output power > + 13 dBm
- High signal-to-noise ratio > 90 dB/0.1 nm
- High wavelength accuracy 0.3 pm(typ.)
- Narrow linewidth < 60 kHz
- Typical Data -



Applications
- Optical characterization of components and modules:
- Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
- WSS and Wavelength Blockers
- DWDM components - Silicon photonic material characterization, including micro-cavity ring resonators
- Spectroscopy
- Quantum dots
Please refer to here for details. -> Swept Test System
Please refer to here for details. -> Customer feedback
Overview
Our TSL-770 is the ideal choice for a wide range of applications, from production to basic research, due to its high speed, narrow linewidth, wide 160 nm tuning range and market leading accuracy and precision. A proprietary resonator design enhances Q value and wavelength stability, opening doors for photonic investigations in the most cutting-edge research applications.

Features&Characteristics
- Wide tuning range from 1480 to 1640 nm
If you require a different wavelength range, please refer to the TSL-550 which offers more wavelength ranges, with options from 1260 to 1680 nm. - Mode-hop-free with rapid sweeps up to 200 nm/s
- High output power > + 13 dBm
- High signal-to-noise ratio > 90 dB/0.1 nm
- High wavelength accuracy 0.3 pm(typ.)
- Narrow linewidth < 60 kHz
- Typical Data -



Applications
- Optical characterization of components and modules:
- Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc
- WSS and Wavelength Blockers
- DWDM components - Silicon photonic material characterization, including micro-cavity ring resonators
- Spectroscopy
- Quantum dots
Please refer to here for details. -> Swept Test System
Please refer to here for details. -> Customer feedback