Swept Test System STS
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Santec
STS
- Real-time power referencing
- Accurate WDL / PDL characteristics measurement
- High power repeatability < ±0.02 dB
- High PDL repeatability ±0.01 dB
- High wavelength resolution and accuracy
- Multichannel measurement is available
- Convenient set up of measurement parameters
- Data analysis
Overview
Santec’s Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, high resolution and accuracy are key.
Combining one of Santec’s tunable lasers (TSL-770 or TSL-570) with an optical power meter (MPM-210H), a polarization control units (PCU-110) and custom software,
the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.
Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT,
the system provides high accuracy in WDL and PDL analysis using the Mueller Matrix Method. Over-sampling and rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity.
The Santec MPM-210H power meter mainframe can be used in conjunction with the 4-channel current meter module, the MPM-213. The Swept Test System combined with the MPM-210H and MPM-213 is suitable for measuring the performance of fiber optics components using transceiver-like photodiodes (ROSA/Coherent receiver, etc.) or optical channel monitors.
Features
- Real-time power referencing
1. Accurate WDL / PDL characteristics measurement
• High power repeatability < ±0.02 dB
• High PDL repeatability ±0.01 dB
2. Automatic normalization of laser source power
- Rescaling algorithm utilizing the Swept Processing Unit (data acquisition unit)
1. High wavelength resolution and accuracy
2. Reduced measurement time
- Multichannel measurement is available
- Supporting Dynamic Link Library (DLLs) to develop software (VB.net, C#, C++ or LabVIEW)
1. Convenient set up of measurement parameters
2. Data analysis
Typical Configuration
Overview
Santec’s Swept Test System has been developed to streamline photonic testing, providing a complete solution where high-speed analysis, high resolution and accuracy are key.
Combining one of Santec’s tunable lasers (TSL-770 or TSL-570) with an optical power meter (MPM-210H), a polarization control units (PCU-110) and custom software,
the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments.
Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT,
the system provides high accuracy in WDL and PDL analysis using the Mueller Matrix Method. Over-sampling and rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity.
The Santec MPM-210H power meter mainframe can be used in conjunction with the 4-channel current meter module, the MPM-213. The Swept Test System combined with the MPM-210H and MPM-213 is suitable for measuring the performance of fiber optics components using transceiver-like photodiodes (ROSA/Coherent receiver, etc.) or optical channel monitors.
Features
- Real-time power referencing
1. Accurate WDL / PDL characteristics measurement
• High power repeatability < ±0.02 dB
• High PDL repeatability ±0.01 dB
2. Automatic normalization of laser source power
- Rescaling algorithm utilizing the Swept Processing Unit (data acquisition unit)
1. High wavelength resolution and accuracy
2. Reduced measurement time
- Multichannel measurement is available
- Supporting Dynamic Link Library (DLLs) to develop software (VB.net, C#, C++ or LabVIEW)
1. Convenient set up of measurement parameters
2. Data analysis
Typical Configuration